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Volume 12 Issue 07
July 2026
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Author(s)
C Rajendra Prasad Mr. M Mahaboob Basha S Bala Mohan
Abstract
Under Ultra-deep Sub-micron Technology Node As There Is Continues Reduction In The Feature Size To Few Nanometers Will Results Adverse Effect Of Process, Voltage And Temperature (PVT) Variations On Design Metrics Of Circuit. Hence It Is Proposed That How
Keywords
Paper ID
IJSARTV10I693223
Publication Date
June 9, 2024
Research Area
ECE