Impact Factor: 7.883
Submit Paper
Volume 3, Issue 5 (May 2017)

Study And Analysis Probability Of Soft Error In Combinational Circuits Using Nor Gate

Impact Factor
7.883
Call For Paper
Volume 12 Issue 07

July 2026

Download Paper Format
Copyright Form
Share on:

Author(s)

Poonam S.Wankhede Asst.Prof.Mrs.Usha Jadhav

Abstract

As The Model Technology Is Being Scaled Down, Physical Defects Occur. Physical Defects Are Those That Can Occur In A Circuit. During Fabrication Of Chip Many Types Of Imperfection Can Occur, For Example, Breaks In Signal Lines, Lines Shorted. Soft Error


Keywords

Soft Error Stuck-at-faults Tolerate Probability Of Failure Masking Factors.

Paper ID

IJSARTV3I514246

Publication Date

May 13, 2017

Research Area

E & TC Engineering

Submit Your Paper to IJSART

Join the global research community with IJSART. Submit your paper, share your work, and gain worldwide recognition!