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Volume 12 Issue 07
July 2026
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Author(s)
V. Annalakshmi K. Kasirajan S. Maheswari M. Karunakaran, C.Subbu
Abstract
Thin Film Of Fe2O3 With Thickness Of 1.2 µm Was Deposited By Successive Ionic Layer Adsorption And Reaction (SILAR) Method Onto Glass Substrates Using Ferrous Sulphate And Sodium Hydroxide As Cationic And Anionic Precursors. The X-ray Diffraction Studies
Keywords
Thin Film
XRD
SILAR
UV-Vis Spectrophotometer
Band Gap.
Paper ID
IJSARTV4I119554
Publication Date
January 14, 2018
Research Area
Physics