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Volume 12 Issue 07
July 2026
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Author(s)
Vinay C Chowkimath Ashwini V Swamy Guthal
Abstract
In The Present Era Of Very Complex Integrated Circuits, DfT (Design For Testability) Plays A Very Important Role In Ensuring The Reliability Of The Integrated Circuits. The Reliability In The Context Of DfT Is Measured In Terms Of Test Coverage Of The Des
Keywords
Dft
Test Coverage
Test Point Insertion
Versa Points
Paper ID
IJSARTV4I724534
Publication Date
July 25, 2018
Research Area
Electronics And Communication