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Volume 12 Issue 07
July 2026
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Author(s)
S.Hemanth Sakunthala.D
Abstract
Transient A Couple Of Cellphone Upsets (MCUs) Are Fitting Number One Issues Inside The Reliability Of Memories Uncovered To Radiation Environment. To Avert MCUs From Inflicting Facts Corruption, Extra Elaborate Error Correction Codes (ECCs) Are Greatly Us
Keywords
Decimal Algorithm
Error Correction Codes (ECCs)
Mean Time To Failure (MTTF)
Memory
More Than One Cells Upsets (MCUs).
Paper ID
IJSARTV3I717135
Publication Date
July 26, 2017
Research Area
ECE