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Volume 12 Issue 07
July 2026
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Author(s)
Preeti Dagar Gurmeet Singh
Abstract
One Of The Major Challenges In Power Electronic Applications Is The Presence Of Parasitic Elements At The Contact Between DUT And The Measuring Instruments. Thus, It Affects The Impedance Measurement Of The Components At High- Frequencies. In Many Applica
Keywords
High-frequency
Impedance
Test Fixture
Parasitic Components
Compensating.
Paper ID
IJSARTV5I632828
Publication Date
June 16, 2019
Research Area
Electronics And Communication Engineering