Impact Factor
7.883
Call For Paper
Volume 12 Issue 07
July 2026
Download Paper Format
Copyright Form
Author(s)
K.Shilpa V.Suresh
Abstract
Since Many Years, BIST Has Used (LFSRs) Linear Feedback Shift Registers To Generate Test Patterns; Nevertheless, A Recent Issue With Design Limitations Has Caused Significant Advancements In This Area. In Order To Create Test Patterns For A Given Primitiv
Keywords
LFSR
BIST
MISR.
Paper ID
IJSARTV10I796313
Publication Date
July 21, 2024
Research Area
ECE