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Volume 4, Issue 7 (July 2018)

A Fast Approach Towards Test Program Generation For Mixed Signal Ic

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7.883
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Volume 12 Issue 07

July 2026

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Author(s)

Sanjeevkumar Naik

Abstract

In VLSI Industries The Cost Of The Product Depends On The Several Factors Like Silicon Cost, Packaging Cost And Testing Cost. Testing Cost Can Be Reduced By The Simplification Of The Test Program Development For The Automatic Tester Equipment(ATE). The Ex


Keywords

Mixed Signal IC ATE Test Program Time To Market

Paper ID

IJSARTV4I724536

Publication Date

July 25, 2018

Research Area

IC Testing

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